| 000 | 00738nam a2200325Ia 4500 | ||
|---|---|---|---|
| 001 | 001076 | ||
| 008 | 141222s9999 xx 000 0 und d | ||
| 040 | _aDB/INS | ||
| 041 | 0 | _aeng | |
| 084 | _aQH207 | ||
| 084 | _bI8x | ||
| 110 | 2 | _a1960 | |
| 111 | 2 | _aInternational symposium II | |
| 111 | 2 | _cSu | |
| 111 | 2 | _d1960 | |
| 245 | 1 | 0 | _aX-ray microscopy and X-ray microanalysis |
| 245 | 1 | 0 | _ceditor A Engström, V Cosslett, H Pattee |
| 260 | _aNew York | ||
| 260 | _bElsevier | ||
| 260 | _c1960 | ||
| 300 | _a542 | ||
| 650 | 1 | _aRayos X | |
| 650 | 2 | _aMicroanálisis por zona electrónica | |
| 700 | 1 | _aCosslett, V | |
| 700 | 1 | _aEngström, A | |
| 700 | 1 | _aPattee, H | |
| 700 | 1 | _eed | |
| 700 | 1 | _eed | |
| 700 | 1 | _eed | |
| 999 |
_c10501 _d10501 |
||